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Volumn 31, Issue 6, 1996, Pages 1609-1614
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Effects of B2O3 and SiO2 on dielectric properties and reliability of a lead-based relaxor dielectric ceramic
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Author keywords
[No Author keywords available]
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Indexed keywords
BORIDES;
COMPOSITION EFFECTS;
DIELECTRIC MATERIALS;
DIELECTRIC PROPERTIES OF SOLIDS;
GRAIN BOUNDARIES;
LEAD COMPOUNDS;
MICROSTRUCTURE;
PERMITTIVITY;
RELIABILITY;
SCANNING;
SILICA;
TRANSMISSION ELECTRON MICROSCOPY;
HUMIDITY LOAD CONDITIONS;
LEAD BASED RELAXOR DIELECTRIC CERAMIC;
RELIABILITY DEGRADATION;
SCANNING TRANSMISSION ELECTRON MICROSCOPY;
WATER SOLUBLE SECONDARY PHASE;
CERAMIC MATERIALS;
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EID: 0030103999
PISSN: 00222461
EISSN: None
Source Type: Journal
DOI: 10.1007/BF00357871 Document Type: Article |
Times cited : (16)
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References (18)
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