Surface-enhanced Raman spectroscopy of monolayer C60 Langmuir-Blodgett films

Thin Solid Films

Volumn 274, Issue 1-2, 1996, Pages 147-149

  Siu, G G ^a   Yulong, Liu ^b   Shishen, Xie ^b   Jingmei, Xu ^c   Tiankai, Li ^c   Linge, Xu ^c  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^b INSTITUTE OF PHYSICS   (China)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Carbon; Langmuir Blodgett films; Raman scattering; Surface and interface states

Indexed keywords

ABSORPTION SPECTROSCOPY; BAND STRUCTURE; DEPOSITION; FULLERENES; GLASS; MOLECULAR STRUCTURE; MONOLAYERS; ORGANIC ACIDS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SURFACES; ULTRAVIOLET SPECTROSCOPY;

HIGHER ORDER RAMAN MODES; OPTICAL GLASS SUBSTRATES; SILVER ISLAND FILM; STEARIC ACID; SURFACE ENHANCED RAMAN SPECTROSCOPY;

LANGMUIR BLODGETT FILMS;

EID: 0030103797     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)07079-6     Document Type: Article

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