Optical properties of AgBiSe2 thin films

Thin Solid Films

Volumn 274, Issue 1-2, 1996, Pages 128-132

  Zayed, H A ^a  

^a Ain Shams University   (Egypt)

Author keywords

Electron diffraction; Evaporation; Growth mechanism; Optical properties

Indexed keywords

ANNEALING; DEPOSITION; ELECTRON DIFFRACTION; EVAPORATION; FILM PREPARATION; HEAT TREATMENT; OPTICAL PROPERTIES; SILVER COMPOUNDS; THERMAL EFFECTS; TRANSMISSION ELECTRON MICROSCOPY; VACUUM TECHNOLOGY; X RAY DIFFRACTION ANALYSIS;

AS DEPOSITED FILMS; CRYSTALLINITY; GROWTH CHARACTERISTICS; OPTICAL CONSTANTS; SELECTED AREA ELECTRON DIFFRACTION; SELENIUM VAPOR PRESSURE; SILVER BISMUTH SELENIDE; THERMAL EVAPORATION;

THIN FILMS;

EID: 0030102632     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)07095-8     Document Type: Article

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