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Volumn 82, Issue 2, 1996, Pages 372-375
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Relation between the phase of the reflected ultrasound and the thickness of a thin layer placed on a solid halfspace
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Author keywords
[No Author keywords available]
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Indexed keywords
MATHEMATICAL MODELS;
PHASE SHIFT;
SENSITIVITY ANALYSIS;
SOLIDS;
TENSORS;
ULTRASONIC REFLECTION;
ULTRASONIC TRANSMISSION;
ULTRASONIC VELOCITY;
ULTRASONIC WAVES;
HOMOGENEOUS PLANE WAVES;
INCIDENT WAVE;
SOLID HALFSPACE;
THICKNESS;
THIN LAYER;
ULTRASONICS;
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EID: 0030102590
PISSN: 14367947
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (3)
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References (13)
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