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Volumn 82, Issue 2, 1996, Pages 372-375

Relation between the phase of the reflected ultrasound and the thickness of a thin layer placed on a solid halfspace

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; PHASE SHIFT; SENSITIVITY ANALYSIS; SOLIDS; TENSORS; ULTRASONIC REFLECTION; ULTRASONIC TRANSMISSION; ULTRASONIC VELOCITY; ULTRASONIC WAVES;

EID: 0030102590     PISSN: 14367947     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (3)

References (13)
  • Reference 정보가 존재하지 않습니다.

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.