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85085782099
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note
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22 whereas we define a monolayer in terms of the number of Co atoms per Mo.
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24
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0029346393
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0027069984
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5244371124
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submitted for publication
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Kühn, M.; Rodriguez, J. A., submitted for publication, 1995.
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Kühn, M.1
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5244306089
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note
-
Saturation coverage is achieved in all cases by employing methanethiol exposures sufficiently large to produce multilayer condensation. The multilayers sublime at ∼120 K and leave behind the saturated layer.
-
-
-
-
34
-
-
5244331419
-
-
note
-
The 15:16 amu ratio was not carefully analyzed in our previous work. Furthermore, the methyl radicals were very difficult to detect when the moveable flag in front of the mass spectrometer was closed, presumably because radicals react on the flag before reaching the detector.
-
-
-
-
36
-
-
85085782458
-
-
note
-
38
-
-
-
-
38
-
-
85085780648
-
-
note
-
2 feature becomes two distinct peaks for the methanethiol reaction on 12 monolayers of Co.
-
-
-
-
39
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0040995012
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Weldon, M. K.; Napier, M. E.; Wiegand, B. C.; Friend, C. M.; Uvdal, P. J. Am. Chem. Soc. 1994, 116, 8328.
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41
-
-
5244307871
-
-
note
-
The high binding energy shoulder is consistently 10-20% of the total integrated S(2p) area for methanethiol on Co heated to various temperatures, sulfur on Co, and various ordered overlayers of sulfur on clean Mo(110).
-
-
-
-
42
-
-
5244277828
-
-
note
-
The percentage of decomposition was calculated by multiplying the C:S ratio by 1.69, which is the sensitivity correction factor for the carbon and sulfur signals. This sensitivity correction factor was calculated from the X-ray photoelectron spectrum of thiophene on Mo-(110) heated to 760 K since thiophene reacts only by decomposing to surface carbon and sulfur.
-
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43
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0027593178
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Xu, H.; Uvdal, P.; Friend, C. M.; Stohr, J. Surf. Sci. 1993, 289, L599.
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0026932083
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Mullins, D. R.; Lyman, P. F.; Overbury, S. H. Surf. Sci. 1992, 277, 64.
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45
-
-
85085783152
-
-
note
-
44 However, the selectivity determined by Auger electron spectroscopy (49 ± 5%) is consistent with the current selectivity of 47 ± 5% determined by X-ray photoelectron spectroscopy.
-
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47
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0026915465
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Heitzinger, J. M.; Gebhard, S. C.; Koel, B. E. Surf. Sci. 1992, 275, 209.
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0001513468
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Campbell, R. A.; Rodriguez, J. A.; Goodman, D. W. Phys. Rev. B 1992, 46, 7077.
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Campbell, R.A.1
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0027642509
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He, J.-W.; Kuhn, W. K.; Goodman, D. W. Surf. Sci. 1993, 292, 248.
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50
-
-
85085782368
-
-
note
-
3/2) peak cited in the text (Table 1).
-
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52
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0003181797
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He, J.; Kuhn, W. K.; Goodman, D. W. J. Am. Chem. Soc. 1991, 113, 6416.
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