Comparison between the He-Ne laser wavelength standards at 633 nm from the UME and the BIPM

Metrologia

Volumn 32, Issue 5, 1995, Pages 363-365

  Erin, M ^a   Malinovsky, I ^a   Titov, A ^a   Chartier, A ^b   Chartier, J M ^b  

^a NATIONAL METROLOGY INSTITUTE   (Turkey)

^b BIPM ^*

Author keywords

[No Author keywords available]

Indexed keywords

FREQUENCY DIFFERENCE; WAVELENGTH STANDARDS;

ELECTRIC FREQUENCY MEASUREMENT; FREQUENCY STABILITY; STANDARDS;

HELIUM NEON LASERS;

EID: 0030102101     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/32/5/2     Document Type: Article

References (8)

1. 2 Controlled He-Ne laser at 633 nm: Preliminary Wavelength
2. Mise en Pratique of the Definition of the Metre (1992)
3. He-Ne Laser Stabilized by Saturated Absorption in I2
4. 2-Stabilized He-Ne Lasers. Spacings of the Hyperfine Structure Components
5. 2-Stabilized He-Ne Lasers at λ ≈ 633 nm
6. International Comparison of Iodine-stabilized Helium-neon Lasers at λ ≈ 633 nm Involving Seven Laboratories
7. 2 wavelength standard at 633 nm and results of an international comparison between the PTB and the UME
8. 2 wavelength standard at 633 nm and results of international comparisons