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Nanotechnology
Volumn 7, Issue 1, 1996, Pages 47-51
Enhancement of instrument and machine capabilities
Author keywords

[No Author keywords available]
Indexed keywords

CORRELATION METHODS; DAMPING; MACHINE TOOLS; MACHINING; NANOTECHNOLOGY; STIFFNESS; SURFACE ROUGHNESS; TRANSFER FUNCTIONS;
EID: 0030100906     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/7/1/007     Document Type: Article
Times cited : (7)
References (4)
  • 1
    • 0023800321 scopus 로고
    • A revised philosophy of surface measuring instruments
    • Whitehouse D J 1988 A revised philosophy of surface measuring instruments Proc. Inst. Mech. Eng. 202(C3) 169
    • (1988) Proc. Inst. Mech. Eng. , vol.202 , Issue.C3 , pp. 169
    • Whitehouse, D.J.1
  • 2
    • 0013021103 scopus 로고
    • Dynamic aspects of scanning surfacee instruments and microscopes
    • Whitehouse D J 1990 Dynamic aspects of scanning surfacee instruments and microscopes Nanotechnology 1 93
    • (1990) Nanotechnology , vol.1 , pp. 93
    • Whitehouse, D.J.1
  • 3
    • 0027887887 scopus 로고
    • Improvement of the fidelity of surface measuring instruments
    • Lui X, Chetwynd D G and Smith S T 1993 Improvement of the fidelity of surface measuring instruments Meas. Sci. Technol. 4 1330
    • (1993) Meas. Sci. Technol. , vol.4 , pp. 1330
    • Lui, X.1    Chetwynd, D.G.2    Smith, S.T.3
  • 4
    • 0029284583 scopus 로고
    • Application of neural networks to the reconstruction of scanning probe microscope images distorted by finite size tips
    • Wang W L and Whitehouse D J 1995 Application of neural networks to the reconstruction of scanning probe microscope images distorted by finite size tips Nanotechnology 6 45
    • (1995) Nanotechnology , vol.6 , pp. 45
    • Wang, W.L.1    Whitehouse, D.J.2

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.