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Volumn 35, Issue 3, 1996, Pages 1716-1719
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Effects of texturing and microbridge length on the IR responsivity OfYBa2Cu3Ox thin film
a a a a a a b b a |
Author keywords
IR responsivity; MOCVD; Superconductor; Texturing; YBa2Cu3Ox
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Indexed keywords
ETCHING;
GRAIN BOUNDARIES;
INFRARED SPECTROSCOPY;
JOSEPHSON JUNCTION DEVICES;
MAGNESIA;
METALLORGANIC CHEMICAL VAPOR DEPOSITION;
MICROSTRUCTURE;
OXIDE SUPERCONDUCTORS;
PHOTOLITHOGRAPHY;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
TEXTURES;
DEPOSITION TEMPERATURE;
INFRARED RESPONSIVITY;
MICROBRIDGE PATTERNS;
YTTRIUM BARIUM CUPRATES;
SUPERCONDUCTING FILMS;
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EID: 0030100709
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.35.1716 Document Type: Article |
Times cited : (3)
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References (9)
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