X-ray Compton backscattering techniques for process tomography: Imaging and characterization of materials

Measurement Science and Technology

Volumn 7, Issue 3, 1996, Pages 281-286

  Zhu, P ^a   Duvauchelle, P ^a   Peix, G ^a   Babot, D ^a  

^a UNIVERSITÉ DE LYON   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; DETECTORS; ELECTROMAGNETIC WAVE BACKSCATTERING; IMAGING TECHNIQUES; INSPECTION; NONDESTRUCTIVE EXAMINATION; OPTICAL COLLIMATORS; PHOTONS; TANKS (CONTAINERS); THICKNESS MEASUREMENT; THREE DIMENSIONAL; X RAY TUBES;

COMPTON SCATTERING; MULTILAYER COMPOUNDS; PROCESS TOMOGRAPHY; THREE DIMENSIONAL IMAGING; X RAY COMPTON BACKSCATTERING;

INDUSTRIAL RADIOGRAPHY;

BACKSCATTERING; FLOW VISUALIZATION; IMAGING TECHNIQUES; NON DESTRUCTIVE TESTING; TOMOGRAPHY;

EID: 0030088385     PISSN: 09570233     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-0233/7/3/008     Document Type: Article

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