Synthesis of ruthenium dioxide thin films by a solution chemistry technique

Journal of the American Ceramic Society

Volumn 79, Issue 2, 1996, Pages 525-529

  Tressler, James F ^a,b   Watanabe, Koji ^a   Tanaka, Masahiro ^a  

^a SONY CORPORATION   (Japan)

^b PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CONDUCTIVITY; ELECTRIC RESISTANCE MEASUREMENT; FIRING (OF MATERIALS); GRAIN GROWTH; GRAIN SIZE AND SHAPE; RUTHENIUM COMPOUNDS; SYNTHESIS (CHEMICAL); THIN FILMS; X RAY DIFFRACTION ANALYSIS;

RUTHENIUM DIOXIDE; SOLUTION CHEMISTRY TECHNIQUE;

CONDUCTIVE FILMS;

EID: 0030087260     PISSN: 00027820     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1151-2916.1996.tb08159.x     Document Type: Article

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