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Volumn 218, Issue 1-4, 1996, Pages 234-237

Conductance steps in point contacts: Quantization or cross-section jumps?

Author keywords

[No Author keywords available]

Indexed keywords

CALCULATIONS; COMPUTER SIMULATION; CRYSTAL ATOMIC STRUCTURE; ELECTRIC RESISTANCE; ELECTRON SCATTERING; MATHEMATICAL MODELS; QUANTUM THEORY; SCANNING TUNNELING MICROSCOPY;

EID: 0030087204     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00602-8     Document Type: Article
Times cited : (17)

References (20)
  • 7
    • 6144258622 scopus 로고
    • L. Olesen, E. Lægsgaard, I. Stensgaard, F. Besenbacher, J. Schiøtz, P. Stoltze, K.W. Jacobsen and J.K. Nørskov, Phys. Rev. Lett. 72 (1994) 2251; Phys. Rev. Lett. 74 (1995) 2147.
    • (1995) Phys. Rev. Lett. , vol.74 , pp. 2147
  • 13
    • 0001665670 scopus 로고
    • J.A. Torres, J.I. Pascual and J.J. Sáenz, Phys. Rev. B 49 (1994) 16581; J.A. Torres and J.J. Sáenz, in: The Ultimate Limits of Fabrication and Measurement, NATO ASI Series E: Applied Sciences, Vol. 292, p. 129, eds. J.K. Gimzewski, M.E. Weiland (Kluwer, Dordrecht, 1995).
    • (1994) Phys. Rev. B , vol.49 , pp. 16581
    • Torres, J.A.1    Pascual, J.I.2    Sáenz, J.J.3
  • 14
    • 0003408831 scopus 로고
    • The Ultimate Limits of Fabrication and Measurement, eds. J.K. Gimzewski, M.E. Weiland Kluwer, Dordrecht
    • J.A. Torres, J.I. Pascual and J.J. Sáenz, Phys. Rev. B 49 (1994) 16581; J.A. Torres and J.J. Sáenz, in: The Ultimate Limits of Fabrication and Measurement, NATO ASI Series E: Applied Sciences, Vol. 292, p. 129, eds. J.K. Gimzewski, M.E. Weiland (Kluwer, Dordrecht, 1995).
    • (1995) NATO ASI Series E: Applied Sciences , vol.292 , pp. 129
    • Torres, J.A.1    Sáenz, J.J.2
  • 16
    • 85029982521 scopus 로고    scopus 로고
    • to be published
    • 0. In a real system, the electrons are not so strongly confined. When the hard-wall condition is removed (A. García, J.A. Torres and J.J. Sáenz, to be published) the results are qualitatively similar but closer to the Sharvin's conductance.
    • García, A.1    Torres, J.A.2    Sáenz, J.J.3
  • 18
    • 4243590112 scopus 로고
    • N. Agraït, J.G. Rodrigo, G. Rubio, C. Sirvent and S. Vieira, Thin Solid Films 253 (1994) 199; N. Agraït, G. Rubio and S. Vieira, Phys. Rev. Lett. 74 (1995) 3995.
    • (1995) Phys. Rev. Lett. , vol.74 , pp. 3995
    • Agraït, N.1    Rubio, G.2    Vieira, S.3
  • 20
    • 85029994933 scopus 로고    scopus 로고
    • in Ref. [6]
    • The atomic disorder just before the rearrangement may produce small dips in the conductance curves as observed by Pascual et al. in Ref. [6]
    • Pascual1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.