Lateral and chemical force microscopy map surface friction

Advanced Materials and Processes

Volumn 149, Issue 2, 1996, Pages 27-28

  Heaton, M G ^a   Prater, C B ^a   Kjoller, K J ^a  

^a Digital Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPOSITE MATERIALS; FRICTION; IMAGE ANALYSIS; LANGMUIR BLODGETT FILMS; MICROSCOPES; POLYCRYSTALLINE MATERIALS; POLYMER BLENDS; SILICON CARBIDE; SURFACE PROPERTIES;

CHEMICAL FORCE MICROSCOPY; LATERAL FORCE MICROSCOPY; SCANNING PROBE MICROSCOPY; TOPOGRAPHICAL MAPPING;

MICROSCOPIC EXAMINATION;

EID: 0030087173     PISSN: 08827958     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (1)

1. "Functional group imaging by chemical force microscopy," by C.D. Frisbie, A. Rozsnyai, A. Noy, M.S. Wrighton, and C.M. Lieber: Science, Vol. 265, p. 2071-2074.