Interferometric measurements of the photoinduced refractive index profiles in photorefractive Bi12TiO20 crystal

Optics Communications

Volumn 123, Issue 4-6, 1996, Pages 597-602

  Garcia Quirino G S ^a   Iturbe Castillo, M D ^a   Sanchez Mondragon J J ^a   Stepanov, S ^a   Vysloukh, V ^a  

^a INSTITUTO NACIONAL DE ASTROFÍSICA   (Mexico)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRIC FIELD EFFECTS; INTERFEROMETRY; LASER BEAMS; LENSES; LIGHT REFRACTION; NUMERICAL ANALYSIS; REFRACTIVE INDEX; SOLITONS;

BISMUTH TITANIUM OXIDE; PHOTOINDUCED REFRACTIVE INDEX; PHOTOREFRACTIVE LENS;

BISMUTH COMPOUNDS;

EID: 0030086803     PISSN: 00304018     EISSN: None     Source Type: Journal    
DOI: 10.1016/0030-4018(95)00580-3     Document Type: Article

References (9)

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