Direct calculation of two-dimensional collection probability in pn junction solar cells, and study of grain-boundary recombination in polycrystalline silicon cells

Journal of Applied Physics

Volumn 79, Issue 4, 1996, Pages 2103-2114

  Al Omar, Abdul Azeez S ^a   Ghannam, Moustafa Y ^a  

^a KUWAIT UNIVERSITY   (Kuwait)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CHARGE CARRIERS; CURRENT DENSITY; FINITE DIFFERENCE METHOD; GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; PARTIAL DIFFERENTIAL EQUATIONS; POLYCRYSTALLINE MATERIALS; PROBABILITY; SENSITIVITY ANALYSIS; SHORT CIRCUIT CURRENTS;

COLLECTION EFFICIENCY; GRAIN BOUNDARY RECOMBINATION; MINORITY CARRIER DIFFUSION LENGTH; ORTHOGONAL BASIS EXPANSION; SPECTRAL RESPONSE; SURFACE RECOMBINATION VELOCITY; TWO DIMENSIONAL COLLECTION PROBABILITY DENSITY;

SILICON SOLAR CELLS;

EID: 0030086639     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361078     Document Type: Article

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