Characterization of δ-doped superlattices by Shubnikov-de Haas measurements

Semiconductor Science and Technology

Volumn 11, Issue 2, 1996, Pages 190-195

  Henriques, A B ^a   Goncalves L C D ^a   De Souza, P L ^b   Yavich, B ^b,c  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

^b PONTIFICAL CATHOLIC UNIVERSITY OF RIO DE JANEIRO   (Brazil)

^c IOFFE INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; CHARACTERIZATION; ELECTRIC PROPERTIES; ELECTRIC VARIABLES MEASUREMENT; ELECTRONIC PROPERTIES; OPTICAL PROPERTIES; SEMICONDUCTOR DOPING;

CARRIER POPULATION; ENERGY SPECTRUM; GAUSSIAN FUNCTION; SHUBNIKOV-DE HAAS MEASUREMENTS; SHUBNIKOV-DE HAAS OSCILLATIONS;

SEMICONDUCTOR SUPERLATTICES;

EID: 0030086630     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/11/2/008     Document Type: Article

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