|
Volumn 32, Issue 4, 1996, Pages 330-332
|
Continuously tunable micromachined vertical cavity surface emitting laser with 18nm wavelength range
a a a |
Author keywords
Micromachining; Semiconductor junction lasers; Vertical cavity surface emitting lasers
|
Indexed keywords
CAVITY RESONATORS;
CONTINUOUS WAVE LASERS;
CURRENT VOLTAGE CHARACTERISTICS;
MIRRORS;
REFRACTIVE INDEX;
SEMICONDUCTING ALUMINUM COMPOUNDS;
SEMICONDUCTING GALLIUM ARSENIDE;
SEMICONDUCTOR QUANTUM WELLS;
TUNING;
ALUMINUM ARSENIDE;
BRAGG REFLECTOR;
CURRENT BLOCKING LAYER;
DEFORMABLE MEMBRANE MIRROR;
LOWER THRESHOLD CURRENT;
MODE SUPPRESSION RATIO;
TUNING VOLTAGE;
VERTICAL CAVITY SURFACE EMITTING LASERS;
WAVELENGTH TUNING;
SEMICONDUCTOR LASERS;
|
EID: 0030086347
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19960276 Document Type: Article |
Times cited : (73)
|
References (6)
|