Contrast transfer function measurement of X-ray solid state linear detectors using bar/space pattern methods

NDT and E International

Volumn 29, Issue 1, 1996, Pages 3-11

  Kaftandjian, V ^a   Zhu, Y M ^b   Peix, G ^a   Babot, D ^a  

^a UNIVERSITÉ DE LYON   (France)

^b CNRS   (France)

Author keywords

Contrast transfer function; Linear detector; X ray

Indexed keywords

CALCULATIONS; COMPUTER SIMULATION; IMAGING SYSTEMS; IMAGING TECHNIQUES; MEASUREMENT THEORY; NONDESTRUCTIVE EXAMINATION; OPTICAL TRANSFER FUNCTION; OPTICAL VARIABLES MEASUREMENT; PERFORMANCE; SOLID STATE DEVICES; X RAYS;

BAR SPACE PATTERN METHODS; CELL APERTURE; CONTRAST TRANSFER FUNCTION; CONTRAST TRANSFER FUNCTION MEASUREMENT; LINEAR SOLID STATE X RAY SENSITIVE DETECTORS;

DETECTORS;

EID: 0030086341     PISSN: 09638695     EISSN: None     Source Type: Journal    
DOI: 10.1016/0963-8695(95)00015-1     Document Type: Article

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