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Volumn 32, Issue 5, 1996, Pages 496-498

Study on recrystallisation of low temperature grown silicon-germanium films for thin film transistor applications

(3)  Kao, H L a   Yang, S Y a   Hong, J W a  

a NONE

Author keywords

Silicon germanium; Thin film transistors

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; ELECTRON TRANSPORT PROPERTIES; FILM GROWTH; MORPHOLOGY; RECRYSTALLIZATION (METALLURGY); RUTHERFORD BACKSCATTERING SPECTROSCOPY; SEMICONDUCTING SILICON COMPOUNDS; SEMICONDUCTOR DEVICE MANUFACTURE; SURFACES; THIN FILM TRANSISTORS;

EID: 0030085361     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19960325     Document Type: Article
Times cited : (3)

References (8)
  • 1
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    • KING, T.-J., and SARASWAT, K.C.: 'Deposition and properties of low-pressure chemical-vapor deposited polycrystalline silicongermanium films', J. Electrochem. Soc., 1994, 141, (8), pp. 2235-2241
    • (1994) J. Electrochem. Soc. , vol.141 , Issue.8 , pp. 2235-2241
    • King, T.-J.1    Saraswat, K.C.2
  • 2
    • 0024886320 scopus 로고
    • Silicon-germanium alloys and heterostructures: Optical and electronic properties
    • PEARSALL, T.P.: 'Silicon-germanium alloys and heterostructures: optical and electronic properties', CRC Crit. Rev. Solid State Mater. Sci., 1989, 15, (6), pp. 551-609
    • (1989) CRC Crit. Rev. Solid State Mater. Sci. , vol.15 , Issue.6 , pp. 551-609
    • Pearsall, T.P.1
  • 3
    • 36449002170 scopus 로고
    • Kinetics of silicon-germanium deposition by atmospheric-pressure chemical vapor deposition
    • KAMINS, T.I., and MEYER, D.J.: 'Kinetics of silicon-germanium deposition by atmospheric-pressure chemical vapor deposition', Appl. Phys. Lett., 1991, 59, (7), pp. 178-180
    • (1991) Appl. Phys. Lett. , vol.59 , Issue.7 , pp. 178-180
    • Kamins, T.I.1    Meyer, D.J.2
  • 4
    • 36549092192 scopus 로고
    • Cooperative growth phenomena in silicon/germanium low-temperature epitaxy
    • MEYERSON, B.S., URAM, K.J., and LEGOUES, F.K.: 'Cooperative growth phenomena in silicon/germanium low-temperature epitaxy', Appl. Phys. Lett., 1988, 53, (25), pp. 2555-2557
    • (1988) Appl. Phys. Lett. , vol.53 , Issue.25 , pp. 2555-2557
    • Meyerson, B.S.1    Uram, K.J.2    Legoues, F.K.3
  • 6
    • 0028480420 scopus 로고
    • Low thermal budge polycrystalline silicon-germanium thin-film transistors fabricated by rapid thermal annealing
    • JURICHICH, S., KING, T.-J., SARASWAT, K., and MEHLHAFF, J.: 'Low thermal budge polycrystalline silicon-germanium thin-film transistors fabricated by rapid thermal annealing', Jpn. J. Appl. Phys., 1994, 33, pp. L1139-L1141
    • (1994) Jpn. J. Appl. Phys. , vol.33
    • Jurichich, S.1    King, T.-J.2    Saraswat, K.3    Mehlhaff, J.4
  • 8
    • 0027840757 scopus 로고
    • Amorphous silicon and silicon-germanium thin-film transistors formed by implantation
    • SARCONA, G., HATALIS, M.K., and CATALANO, A.: 'Amorphous silicon and silicon-germanium thin-film transistors formed by implantation'. Mater. Res. Soc. Symp. Proc., 1993, 297, pp. 907-912
    • (1993) Mater. Res. Soc. Symp. Proc. , vol.297 , pp. 907-912
    • Sarcona, G.1    Hatalis, M.K.2    Catalano, A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.