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Volumn 32, Issue 5, 1996, Pages 496-498
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Study on recrystallisation of low temperature grown silicon-germanium films for thin film transistor applications
a a a
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NONE
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Author keywords
Silicon germanium; Thin film transistors
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Indexed keywords
ANNEALING;
ATOMIC FORCE MICROSCOPY;
CHEMICAL VAPOR DEPOSITION;
ELECTRON TRANSPORT PROPERTIES;
FILM GROWTH;
MORPHOLOGY;
RECRYSTALLIZATION (METALLURGY);
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SEMICONDUCTING SILICON COMPOUNDS;
SEMICONDUCTOR DEVICE MANUFACTURE;
SURFACES;
THIN FILM TRANSISTORS;
DOPANT ACTIVATION;
FURNACE ANNEALING;
RECRYSTALLIZATION;
SILICON GERMANIUM FILMS;
AMORPHOUS FILMS;
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EID: 0030085361
PISSN: 00135194
EISSN: None
Source Type: Journal
DOI: 10.1049/el:19960325 Document Type: Article |
Times cited : (3)
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References (8)
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