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Volumn 44, Issue 2, 1996, Pages 193-197
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Measurements of the low-frequency-gain fluctuations of a 30-GHz high-electron-mobility-transistor cryogenic amplifier
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Author keywords
[No Author keywords available]
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Indexed keywords
CRYOGENIC EQUIPMENT;
ELECTRIC CURRENTS;
GAIN MEASUREMENT;
HIGH ELECTRON MOBILITY TRANSISTORS;
SPURIOUS SIGNAL NOISE;
DRAIN CURRENT FLUCTUATIONS;
HIGH ELECTRON MOBILITY TRANSISTOR CRYOGENIC AMPLIFIER;
LOW FREQUENCY GAIN FLUCTUATIONS;
POWER-POWER CORRELATION TECHNIQUE;
MICROWAVE AMPLIFIERS;
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EID: 0030085303
PISSN: 00189480
EISSN: None
Source Type: Journal
DOI: 10.1109/22.481567 Document Type: Article |
Times cited : (29)
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References (6)
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