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Volumn 118, Issue 1, 1996, Pages 20-29

FT-IR measurements of emissivity and temperature during high flux solar processing

Author keywords

[No Author keywords available]

Indexed keywords

FIBER OPTICS; FOURIER TRANSFORM INFRARED SPECTROSCOPY; FURNACES; HIGH TEMPERATURE OPERATIONS; LASERS; PROCESS CONTROL; SOLAR EQUIPMENT; SPECTROMETERS; SYNTHESIS (CHEMICAL); TEMPERATURE MEASUREMENT;

EID: 0030085054     PISSN: 01996231     EISSN: 15288986     Source Type: Journal    
DOI: 10.1115/1.2847904     Document Type: Article
Times cited : (11)

References (14)
  • 7
    • 0028368778 scopus 로고
    • Spectroscopic Method for Measuring Surface Temperature that is Independent of Material Emissivity, Surrounding Radiation Sources, and Instrument Calibration
    • Markham, J. R., Best, P. E., and Solomon, P. R., 1994, “Spectroscopic Method for Measuring Surface Temperature that is Independent of Material Emissivity, Surrounding Radiation Sources, and Instrument Calibration,” Applied Spectroscopy, Vol. 48, No. 2.
    • (1994) Applied Spectroscopy , vol.48 , Issue.2
    • Markham, J.R.1    Best, P.E.2    Solomon, P.R.3
  • 8
    • 0026855365 scopus 로고
    • Measurement of Radiative Properties of Ash and Slag by FT-IR Emission and Reflection Spectroscopy
    • Markham, J. R., Best, P. E., Solomon, P. R., and Yu, Z. Z., 1992, “Measurement of Radiative Properties of Ash and Slag by FT-IR Emission and Reflection Spectroscopy,” ASME Journal of Heat Transfer, Vol. 114, pp. 458-464.
    • (1992) ASME Journal of Heat Transfer , vol.114 , pp. 458-464
    • Markham, J.R.1    Best, P.E.2    Solomon, P.R.3    Yu, Z.Z.4
  • 9
  • 10
    • 0000857872 scopus 로고
    • An FT-IR Based Instrument for Measuring Spectral Emittance of Material at high Temperature
    • Markham, J. R., Solomon, P. R., and Best, P. E., 1990, “An FT-IR Based Instrument for Measuring Spectral Emittance of Material at high Temperature,” Rev. Sci. Instru., Vol. 61, No. 12, p. 3700.
    • (1990) Rev. Sci. Instru , vol.61 , Issue.12 , pp. 3700
    • Markham, J.R.1    Solomon, P.R.2    Best, P.E.3
  • 11
    • 0022659296 scopus 로고
    • A Method for Measuring Optical Properties of Semitransparent Materials at High Temperatures
    • Meyers, V. H., Ono, A., and DeWitt, D, P., 1986, “A Method for Measuring Optical Properties of Semitransparent Materials at High Temperatures,” AIAA J., Vol. 24, p. 321.
    • (1986) AIAA J , vol.24 , pp. 321
    • Meyers, V.H.1    Ono, A.2    Dewitt, D.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.