A low-energy electron diffraction data acquisition system for very low electron doses based upon a slow scan charge coupled device camera

Review of Scientific Instruments

Volumn 67, Issue 2, 1996, Pages 378-383

  Held, G ^a,b   Uremovic S ^a   Stellwag, C ^a   Menzel, D ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; CHARGE COUPLED DEVICES; DATA ACQUISITION; DIFFRACTION; DIGITAL IMAGE STORAGE; ELECTRON BEAMS; INTERFACES (COMPUTER); LOW ENERGY ELECTRON DIFFRACTION; SURFACE STRUCTURE; TEMPERATURE CONTROL;

BEAM INTENSITY; DATA ACQUISITION SYSTEM; EFFECTIVE EXPOSURE TIMES; TOTAL MEASUREMENT TIMES;

VIDEO CAMERAS;

EID: 0030085045     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1146599     Document Type: Article

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