Alignment of single-crystal zeolites by means of microstructured surfaces

Advanced Materials

Volumn 8, Issue 2, 1996, Pages 137-139

  Scandella, Loris ^a   Binder, Gunnar ^a   Gobrecht, Jens ^a  

^a PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION; ETCHING; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; MORPHOLOGY; NAPHTHALENE; SILICON WAFERS; SINGLE CRYSTALS; SURFACES; X RAY DIFFRACTION;

MICROSTRUCTURED SURFACES; SCANNING FORCE MICROSCOPY; SILICALITE ZEOLITE; ULTRAVIOLET VISIBLE SPECTRA;

ZEOLITES;

EID: 0030084835     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.19960080206     Document Type: Article

References (2)

1. G. A. Ozin, Adv. Mater. 1992, 4, 612.
2. K. Alberti, F. Felting, Sens. Actuators B 1994, 21, 39.