Applications of the upside-down normal loss function

IEEE Transactions on Semiconductor Manufacturing

Volumn 9, Issue 1, 1996, Pages 143-145

  Drain, David ^a   Gough, Andrew M ^a  

^a INTEL CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTATIONAL METHODS; OPTIMIZATION; PROCESS CONTROL; SEMICONDUCTOR DEVICE MODELS;

MULTIVARIATE LOSS FUNCTION; UPSIDE DOWN NORMAL LOSS FUNCTION (UDNLF);

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 0030083890     PISSN: 08946507     EISSN: None     Source Type: Journal    
DOI: 10.1109/66.484295     Document Type: Article

References (8)

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