Interrupted ultrasonic bolt load measurements using the pulsed phase-locked loop system

IEEE Transactions on Instrumentation and Measurement

Volumn 45, Issue 1, 1996, Pages 112-116

  Froggatt, Mark E ^b   Allison, Sidney G ^a,b  

^a IEEE

^b NASA LANGLEY RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

MATHEMATICAL MODELS; SENSITIVITY ANALYSIS; SPURIOUS SIGNAL NOISE; TIME DOMAIN ANALYSIS; ULTRASONIC TRANSDUCERS;

INTERRUPTED ULTRASONIC BOLT LOAD MEASUREMENTS; PHASE LOCK POINT REACQUISITION METHOD; PULSED PHASE LOCKED LOOPS (PPLL);

PHASE LOCKED LOOPS;

EID: 0030083774     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/19.481321     Document Type: Article

References (9)

1. S. G. Allison and C. G. Clendenin, "Ultrasonic pulsed phase locked loop interferometer for bolt load measurements," in Proc. 35th Int. Instrumentation Symp., Instrument Society of America, May 1-4, 1989, pp. 189-194.
2. M. S. Conradi, J. G. Miller and J. S. Heyman, "A transmission oscillator ultrasonic spectrometer," Rev. Sci. Instrum., vol. 45, no. 3, Mar. 1974.
3. J. S. Heyman, "A CW ultrasonic bolt strain monitor," Exp. Mech., vol. 17, pp. 183-187, 1977.
4. _, "Pulsed phase locked loop strain monitor," U.S. Patent no. 4,363,242, Dec. 14, 1982.
5. J. S. Heyman and E. J. Chern, "Ultrasonic measurement of axial stress," J. Testing and Evaluation, vol. 10, no. 5, pp. 202-211, Sept. 1982.
6. J. Gleeson, "Final report on freight bearing cone bore profile measurement and cap screw tension measurement surveys contract no. DTRS-57-83-C-00090" to Dept. of Transportation, Transportation Systems Center, Battelle, 505 King Avenue, Columbia, OH 43201-2693, Feb. 9, 1989.
7. J. S. Heyman, "Method of recertifying a loaded bearing member using a phase point," U.S. Patent no. 5,237,516, Aug. 17, 1993.
8. S. G. Allison, "Method of recertifying a loaded bearing member," U.S. Patent no. 5,150,020, Sept. 29, 1992.
9. M. E. Froggatt and S. G. Allison "Pulsed phase-locked loop technology improvements for greater accuracy and expanded capabilities," IEEE Trans. Instrum. Meas., vol. 45, no. 1, pp. 117-122.