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Volumn , Issue 22, 1996, Pages 55-58

Electronic interconnect reliability modelling

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; MICROSTRUCTURE; RELIABILITY; SOLDERED JOINTS; SOLDERING ALLOYS; STRAIN; SURFACE MOUNT TECHNOLOGY; THERMAL CYCLING; THERMAL STRESS;

EID: 0030083759     PISSN: 09540911     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (4)

References (13)
  • 2
    • 0026121845 scopus 로고
    • Thermal Cycling Induced Plastic Deformation in Solder Joints
    • March
    • Pan, T., 'Thermal Cycling Induced Plastic Deformation in Solder Joints', Transactions ASME, Vol. 113, pp. 8-15, March (1991).
    • (1991) Transactions ASME , vol.113 , pp. 8-15
    • Pan, T.1
  • 5
    • 0000954018 scopus 로고
    • Physical and Mechanical Properties of Intermetallic Compounds Commonly Found in Solder Joints
    • Cieslak, Perepezko, Kang & Glicksman (Eds.)
    • Fields, R., Low, S. and Lucey G., 'Physical and Mechanical Properties of Intermetallic Compounds Commonly Found in Solder Joints', in 'The Metal Science of Joining', Cieslak, Perepezko, Kang & Glicksman (Eds.), pp. 165-173, (1992).
    • (1992) The Metal Science of Joining , pp. 165-173
    • Fields, R.1    Low, S.2    Lucey, G.3
  • 7
    • 0001784769 scopus 로고
    • Reliability of Plastic Ball Grid Array Assembly
    • edited by J. Lau, McGraw-Hill
    • Darveaux, R., Banerji, K., Mawer, A. and Dody, G., 'Reliability of Plastic Ball Grid Array Assembly', in 'Ball Grid Array Technology', edited by J. Lau, McGraw-Hill, pp. 379-442 (1995).
    • (1995) Ball Grid Array Technology , pp. 379-442
    • Darveaux, R.1    Banerji, K.2    Mawer, A.3    Dody, G.4
  • 8
    • 0027663777 scopus 로고
    • Finite Element Analysis for Solder Ball Connect Structural Optimisation
    • September
    • Corbin, J., 'Finite Element Analysis for Solder Ball Connect Structural Optimisation' IBM Journal of Research, Vol. 37, No. 5, pp. 585-597, September (1993).
    • (1993) IBM Journal of Research , vol.37 , Issue.5 , pp. 585-597
    • Corbin, J.1
  • 9
    • 0026378024 scopus 로고
    • Fatigue Analysis of Flip Chip Assemblies using Thermal Stress Simulations and a Coffin-Manson Relation
    • Darveaux, R. and Banerji, K., 'Fatigue Analysis of Flip Chip Assemblies using Thermal Stress Simulations and a Coffin-Manson Relation', Proceedings 41st Electronic Components and Technology Conference, pp. 797-805 (1991).
    • (1991) Proceedings 41st Electronic Components and Technology Conference , pp. 797-805
    • Darveaux, R.1    Banerji, K.2
  • 10
    • 0023862110 scopus 로고
    • Solder Modelling for Surface Mount Technology
    • Moore, A., Elston, R. and Burrows, D., 'Solder Modelling for Surface Mount Technology', GEC Journal of Research, Vol. 6, No. 1, pp. 16-24 (1988).
    • (1988) GEC Journal of Research , vol.6 , Issue.1 , pp. 16-24
    • Moore, A.1    Elston, R.2    Burrows, D.3
  • 13
    • 0027662512 scopus 로고
    • Solder Ball Connect Assemblies under Thermal Loading
    • September
    • Guo, Y., Lim, C. K., Chen, W. T. and Woychik C. G., 'Solder Ball Connect Assemblies under Thermal Loading', IBM Journal of Research, Vol. 37, No. 5, pp. 635-649, September (1993).
    • (1993) IBM Journal of Research , vol.37 , Issue.5 , pp. 635-649
    • Guo, Y.1    Lim, C.K.2    Chen, W.T.3    Woychik, C.G.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.