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Volumn , Issue 22, 1996, Pages 55-58
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Electronic interconnect reliability modelling
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Author keywords
[No Author keywords available]
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Indexed keywords
COMPUTER SIMULATION;
ELECTRONICS PACKAGING;
FINITE ELEMENT METHOD;
MATHEMATICAL MODELS;
MICROSTRUCTURE;
RELIABILITY;
SOLDERED JOINTS;
SOLDERING ALLOYS;
STRAIN;
SURFACE MOUNT TECHNOLOGY;
THERMAL CYCLING;
THERMAL STRESS;
ELECTRONIC COMPONENTS;
ELECTRONIC INTERCONNECT;
LIFE PREDICTION TECHNIQUES;
MATERIAL NONLINEARITY;
ELECTRONIC EQUIPMENT;
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EID: 0030083759
PISSN: 09540911
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (4)
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References (13)
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