Characterisation of metal mirrors on GaAs

Electronics Letters

Volumn 32, Issue 4, 1996, Pages 319-320

  Babic D I ^a   Mirin, R P ^a   Hu, E L ^a   Bowers, J E ^a  

^a University of California   (United States)

Author keywords

Gallium arsenide; Integrated optics; Semiconductor metal boundaries

Indexed keywords

COATINGS; FABRY-PEROT INTERFEROMETERS; GOLD; INTERFACES (MATERIALS); LIGHT ABSORPTION; LIGHT REFLECTION; MIRRORS; OPTICAL VARIABLES MEASUREMENT; PALLADIUM; SEMICONDUCTING GALLIUM ARSENIDE; SILVER; TITANIUM;

COMPOSITE METAL COATINGS; INTERFACE REFLECTIVITY; METAL MIRRORS; REFLECTION COEFFICIENTS;

SEMICONDUCTOR METAL BOUNDARIES;

EID: 0030083310     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:19960230     Document Type: Article

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