Optical properties of tin-doped indium oxide determined by spectroscopic ellipsometry

Journal of Applied Physics

Volumn 79, Issue 3, 1996, Pages 1722-1729

  Gerfin, Tobias ^a   Grätzel, Michael ^a  

^a Lab Photonique et Interfaces   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CHEMICAL VAPOR DEPOSITION; COATINGS; ELLIPSOMETRY; FREQUENCIES; NUMERICAL METHODS; OPTICAL PROPERTIES; OXIDES; PERMITTIVITY; SURFACE ROUGHNESS; ULTRAVIOLET SPECTROSCOPY;

CAUCHY DISPERSION FORMULA; INCIDENCE ANGLES; INDIUM TIN OXIDE; NIOBIUM OXIDE; OPTICAL CONSTANTS; PLASMA FREQUENCY; SPECTROSCOPIC ELLIPSOMETRY;

SEMICONDUCTING INDIUM COMPOUNDS;

EID: 0030083154     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360960     Document Type: Article

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