Radiation-induced electrical degradation experiments in the Japan Materials Testing Reactor

Journal of Nuclear Materials

Volumn 228, Issue 1, 1996, Pages 117-128

  Farnum, Eugene H ^a   Shikama, Tatsuo ^b   Narui, Minoru ^b   Sagawa, Tsutomu ^c   Scarborough, Kent ^a  

^a LOS ALAMOS NATIONAL LABORATORY   (United States)

^b TOHOKU UNIVERSITY   (Japan)

^c JAPAN ATOMIC ENERGY AGENCY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEGRADATION; ELECTRIC CONDUCTIVITY; ELECTRIC FIELD EFFECTS; ELECTRIC INSULATING MATERIALS; LEAKAGE CURRENTS; NEUTRON IRRADIATION; NUCLEAR REACTORS;

INSULATED CABLES; LIGHT WATER REACTOR; RADIATION-INDUCED ELECTRICAL DEGRADATION;

MATERIALS TESTING;

EID: 0030082734     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/0022-3115(95)00147-6     Document Type: Article

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