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Volumn 44, Issue 2, 1996, Pages 261-268
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A monolithic DC temperature compensation bias scheme for multistage HEMT integrated circuits
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC CURRENT CONTROL;
GAIN MEASUREMENT;
INTEGRATED CIRCUIT LAYOUT;
MICROWAVE AMPLIFIERS;
MONOLITHIC MICROWAVE INTEGRATED CIRCUITS;
PERFORMANCE;
RELIABILITY;
SIGNAL TO NOISE RATIO;
SPURIOUS SIGNAL NOISE;
TEMPERATURE CONTROL;
COMPENSATED CURRENT MIRROR BIAS SCHEME;
INTEGRATED MICROWAVE ASSEMBLIES;
NOISE FIGURE;
REGULATE CURRENT MIRROR CIRCUIT;
VOLTAGE REFERENCE CIRCUIT;
HIGH ELECTRON MOBILITY TRANSISTORS;
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EID: 0030081929
PISSN: 00189480
EISSN: None
Source Type: Journal
DOI: 10.1109/22.481575 Document Type: Article |
Times cited : (11)
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References (4)
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