Monolithic low-power 16b 1Msamples/s self-calibrating pipeline ADC

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 39, Issue , 1996, Pages 312-313

  Mayes, Michael K ^a   Chin, Sing W ^a  

^a NATIONAL SEMICONDUCTOR CORPORATION   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CALIBRATION; CAPACITORS; CMOS INTEGRATED CIRCUITS; COMPARATOR CIRCUITS; CROSSTALK; DIGITAL CIRCUITS; ERROR CORRECTION; ERRORS; MONOLITHIC INTEGRATED CIRCUITS; PIPELINE PROCESSING SYSTEMS; RANDOM ACCESS STORAGE; ROM;

ANALOG SIGNALS; CHANGE INJECTION; CUSTOM MICROCONTROLLER; DIGITAL CORRECTION CIRCUITRY; INTEGRAL NON-LINEARITY; SELF CALIBRATION;

ANALOG TO DIGITAL CONVERSION;

EID: 0030081881     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)