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Volumn 218, Issue 1-4, 1996, Pages 77-80
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Characterization of point-contacts showing size-effect in electron scattering by magnetic impurities
a,b a,b a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
COPPER ALLOYS;
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRON SCATTERING;
ELECTRONS;
IMPURITIES;
MAGNETIZATION;
PHONONS;
SPECTROSCOPY;
CURRENT FLOW;
ELECTRON IMPURITY SCATTERING;
ELECTRON PHONON INTERACTION;
KONDO EFFECT STRUCTURE;
KONDO PEAK INTENSITY;
MAGNETIC SCATTERING;
POINT CONTACT SPECTROSCOPY;
SIZE EFFECT;
POINT CONTACTS;
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EID: 0030080963
PISSN: 09214526
EISSN: None
Source Type: Journal
DOI: 10.1016/0921-4526(95)00563-3 Document Type: Article |
Times cited : (5)
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References (7)
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