The correlation of dimensionality with emitted wavelength and ordering of freshly produced porous silicon

Journal of Applied Physics

Volumn 79, Issue 3, 1996, Pages 1351-1356

  Zhang, Qi ^a   Bayliss, S C ^a  

^a DE MONTFORT UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIC OXIDATION; ENERGY GAP; FOURIER TRANSFORMS; MATHEMATICAL MODELS; NANOSTRUCTURED MATERIALS; PHASE SHIFT; PHOTOLUMINESCENCE; SEMICONDUCTOR QUANTUM WIRES; SILICON WAFERS; X RAY SPECTROSCOPY;

COORDINATION NUMBERS; DEBYE-WALLER ORDER FACTORS; DIMENSIONALITY; EXTENDED X RAY ABSORPTION FINE STRUCTURE; NEAR EDGE X RAY ABSORPTION FINE STRUCTURE; PHOTOLUMINESCENCE EXCITATIONS; QUANTUM NANOWIRE;

POROUS SILICON;

EID: 0030080750     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.361032     Document Type: Article

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