Surface analysis with 1014-1015 W cm-2 laser intensities

Surface and Interface Analysis

Volumn 24, Issue 2, 1996, Pages 79-85

  He, Chun ^a   Becker, Christopher H ^a  

^a SRI INTERNATIONAL   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IONIZATION OF GASES; IONIZATION OF SOLIDS; LASER BEAMS; MULTIPHOTON PROCESSES; PHOTOIONIZATION; SPUTTER DEPOSITION; SURFACE TESTING;

HIGH-INTENSITY MULTIPHOTON IONIZATION; QUANTITATIVE SURFACE ANALYSIS;

LASER DIAGNOSTICS;

EID: 0030080704     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199602)24:2<79::AID-SIA91>3.0.CO;2-8     Document Type: Article

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