Scanning force microscopy application to polymer surfaces for novel nanoscale surface characterization

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 304-307

  Motomatsu, Makoto ^a   Nie, Heng Yong ^b   Mizutani, Wataru ^b   Tokumoto, Hiroshi ^b  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

Atomic force microscopy; Polymers; Surface structure

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; ELASTICITY; ELASTOMERS; FRICTION; MECHANICAL VARIABLES MEASUREMENT; NANOTECHNOLOGY; ORGANIC POLYMERS; PHASE SEPARATION; POLYETHYLENE OXIDES; POLYMER BLENDS; POLYSTYRENES;

ACETAL RESIN ELASTOMER BLEND PLATE; ELASTICITY MEASUREMENT; FRICTION MEASUREMENT; NANOSCALE SURFACE CHARACTERIZATION; SCANNING FORCE MICROSCOPY;

SURFACE STRUCTURE;

EID: 0030080605     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06792-2     Document Type: Article

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