Defects and stability of a-Si:H by simulations of photothermal deflection spectroscope

Tien Tzu Hsueh Pao/Acta Electronica Sinica

Volumn 24, Issue 2, 1996, Pages 119-123

  Zhu, Meifang ^a   Luo, Guangming ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; STABILITY;

PHOTOTHERMAL DEFLECTION SPECTROSCOPY;

AMORPHOUS SILICON;

EID: 0030079805     PISSN: 03722112     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (4)