Experimental observation of single-asperity friction at the atomic scale

Thin Solid Films

Volumn 273, Issue 1-2, 1996, Pages 317-321

  Putman, Constant ^b   Kaneko, Reizo ^a  

^a NTT Advanced Technology Corporation   (Japan)

^b NTT CORPORATION   (Japan)

Author keywords

Atomic force microscopy; Mica; Tribology

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONTAMINATION; CONTINUUM MECHANICS; FORCE MEASUREMENT; LOADS (FORCES); MATHEMATICAL MODELS; MICA; SILICON NITRIDE; SURFACE MEASUREMENT; TRIBOLOGY;

ATOMIC SCALE; COMPOSITE TIP MODEL; CONTINUUM HERTZ CONTACT THEORY; FRICTION MEASUREMENT; SINGLE ASPERITY FRICTION;

FRICTION;

EID: 0030079196     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/0040-6090(95)06795-7     Document Type: Article

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