Wavefront characterization with a miniaturized Shack-Hartmann Sensor

Optik (Jena)

Volumn 101, Issue 4, 1996, Pages 151-156

  Du, C ^a,b   Zurl K ^a   Schwider, J ^a  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; IMAGE SENSORS; MINIATURE INSTRUMENTS; WAVEFRONTS;

MINIATURIZED SHACK HARTMANN SENSOR; WAVEFRONT CHARACTERIZATION;

OPTICAL SENSORS;

EID: 0030078998     PISSN: 00304026     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)

1. D. Malacara: Optical Shop Testing. Wiley and Sons, New York 1978.
2. J. L. Rayces: Exact relation between wave aberration and ray aberration. Optical Acta 11 (1964) 85-88.
3. M. P. Rimmer: Evaluation of large aberation using a lateral-Shear interferometer having variable shear. Appl. Optics 14 (1975) 142-150.
4. W. H. Press, B. P. Flannery, S. A. Teukolsky, W. T. Vetterling: Numerical Recipes in C. Cambridge University Press 1991.
5. N. Lindlein, J. Schwider: Ray Trace Program and Handbook, Version 4.0 University of Erlangen 1994.