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Volumn 35, Issue 2 SUPPL. B, 1996, Pages 1054-1059
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Ultrauniform chemical mechanical polishing (CMP) using a "hydro chuck", featured by wafer mounting on a quartz glass plate with fully flat, water-supported surface
a a a
a
NEC CORPORATION
(Japan)
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Author keywords
Chemical mechanical polishing; CMP apparatus; Interlayer dielectric film; Planarization; Shallow trench isolation
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Indexed keywords
ABRASIVES;
CHEMICAL VAPOR DEPOSITION;
DIELECTRIC FILMS;
INCLUSIONS;
LENSES;
SEMICONDUCTING POLYMERS;
SILICA;
SURFACES;
WATER;
CHEMICAL MECHANICAL POLISHING;
ELASTIC FILM;
INTERLAYER DIELECTRIC FILM;
OPTICAL LENS POLISHING TECHNIQUE;
PLANARIZATION;
QUARTZ GLASS PLATE;
SHALLOW TRENCH ISOLATION;
WAFER CHUCK STRUCTURE;
WAFER MOUNTING;
CHEMICAL POLISHING;
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EID: 0030078908
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.35.1054 Document Type: Article |
Times cited : (12)
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References (8)
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