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Volumn 35, Issue 2 SUPPL. B, 1996, Pages 1054-1059

Ultrauniform chemical mechanical polishing (CMP) using a "hydro chuck", featured by wafer mounting on a quartz glass plate with fully flat, water-supported surface

Author keywords

Chemical mechanical polishing; CMP apparatus; Interlayer dielectric film; Planarization; Shallow trench isolation

Indexed keywords

ABRASIVES; CHEMICAL VAPOR DEPOSITION; DIELECTRIC FILMS; INCLUSIONS; LENSES; SEMICONDUCTING POLYMERS; SILICA; SURFACES; WATER;

EID: 0030078908     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.35.1054     Document Type: Article
Times cited : (12)

References (8)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.