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Volumn 36, Issue 2, 1996, Pages 254-257
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Accessibility of very low qa (VLQ) and ultra-low qa (ULQ) discharges in the SINP tokamak
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DIFFUSION IN GASES;
ELECTRIC DISCHARGES;
ELECTRIC FIELD EFFECTS;
RESISTIVE DIFFUSION;
TOKAMAK DEVICES;
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EID: 0030073432
PISSN: 00295515
EISSN: None
Source Type: Journal
DOI: 10.1088/0029-5515/36/2/I12 Document Type: Article |
Times cited : (16)
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References (13)
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