Characterization of planar local arrangement by means of the Delaunay neighbourhood

Journal of Microscopy

Volumn 181, Issue 1, 1996, Pages 45-53

  Bertram, M ^a   Wendrock, H ^a  

^a IFW DRESDEN   (Germany)

Author keywords

Delaunay triangulation; Drichlet tessellation; Germ grain models; Image analysis; Neighbourhood; Stochastic geometry

Indexed keywords

STOCHASTIC MODELS;

DELAUNAY; DELAUNAY TRIANGULATION; DRICHLET TESSELLATION; GERM-GRAIN MODEL; IMAGE-ANALYSIS; MICRO-STRUCTURES; NEIGHBOURHOOD; RANDOM DISTRIBUTION; STOCHASTIC GEOMETRY; VARIATION COEFFICIENT;

STOCHASTIC SYSTEMS;

ALGORITHM; ARTICLE; IMAGE ANALYSIS; MICROSCOPY; PRIORITY JOURNAL;

EID: 0030066756     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1996.93374.x     Document Type: Article

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