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Volumn 33, Issue 3, 1996, Pages 241-250

Thickness measurement of hydrated and dehydrated cryosections by EELS

Author keywords

Cryoultramicrotomy; EELS; Hydrated cryosections; Inelastic mean free path; Thickness measurement

Indexed keywords

CYTOLOGY; ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ELECTRONS; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; INELASTIC SCATTERING; SCANNING ELECTRON MICROSCOPY; SHRINKAGE;

EID: 0030044407     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19960215)33:3<241::AID-JEMT1>3.0.CO;2-T     Document Type: Article
Times cited : (21)

References (0)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.