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Volumn 52, Issue 1, 1996, Pages 176-183

Testing the homogeneity of kappa statistics

Author keywords

Agreement; Binary data; Goodness of fit; Reliability

Indexed keywords

INTELLIGENT SYSTEMS;

EID: 0030003468     PISSN: 0006341X     EISSN: None     Source Type: Journal    
DOI: 10.2307/2533154     Document Type: Article
Times cited : (67)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.