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note
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Reflections used for azimuthal scans were located near χ = 90° and the intensities were measured at 10° increments of rotation of the crystal about the diffraction vector.
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84
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13344291905
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SMART Area-Detector Software Package; Siemens Industrial Automation, Inc.: Madison, WI, 1993
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(a) SMART Area-Detector Software Package; Siemens Industrial Automation, Inc.: Madison, WI, 1993.
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89
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0004015299
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DIRDIF92: The DIRDIF Program System
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University of Nijmegen. The Netherlands
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(f) Beurskens, P. T.; Admiraal, G.; Beurskens, G.; Bosman, W. P.; Garcia-Granda, S.; Gould, R. O.; Smits, J. M. M.; Smykalla. C. DIRDIF92: The DIRDIF Program System; Technical Report of the Crystallography Laboratory, University of Nijmegen. The Netherlands, 1992.
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(1992)
Technical Report of the Crystallography Laboratory
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Beurskens, P.T.1
Admiraal, G.2
Beurskens, G.3
Bosman, W.P.4
Garcia-Granda, S.5
Gould, R.O.6
Smits, J.M.M.7
Smykalla, C.8
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