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15844409943
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X-ray crystallographic data were collected using the ω/2θ technique on a RIGAKU AFC7R diffractometer with graphite-monochromated Mo Ka radiation (λ = 0.71069 Å) to maximum 2θ = 55° at room temperature. The structures were solved by direct methods using SAPI 91 for complex 1 and SHELXS-86 for complex 2 and refined by full-matrix least squares for observed unique reflections with 1 > 3σ(1).
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14
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15844404518
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note
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w = 3.7% for 2855 reflections.
-
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15
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15844431150
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note
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w = 9.7% for 3613 reflections.
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