Battery of neurobehavioral tests recommended to ATSDR: Solvent-induced deficits in microelectronic workers

Toxicology and Industrial Health

Volumn 12, Issue 2, 1996, Pages 235-243

  Hudnell, H Kenneth ^a   Boyes, William K ^d   Otto, David A ^d   House, Dennis E ^d   Creason, John P ^d   Geller, Andrew M ^b   Darcey, Dennis J ^c   Broadwell, David K ^d  

^a U S ENVIRONMENTAL PROTECTION AGENCY   (United States)

^b UNIVERSITY OF NORTH CAROLINA   (United States)

^c DUKE UNIVERSITY   (United States)

^d NONE

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ELECTRONICS INDUSTRY; ENVIRONMENTAL EXPOSURE; HAZARDOUS WASTE; HUMAN; NEUROPSYCHOLOGICAL TEST; OCCUPATIONAL HAZARD; STATISTICAL ANALYSIS;

EID: 0029980843     PISSN: 07482337     EISSN: None     Source Type: Journal    
DOI: 10.1177/074823379601200211     Document Type: Article

References (7)

1. Agency for Toxic Substances and Disease Registry. (1992). Neurobehavioral test batteries for use in environmental health field studies. Atlanta: U.S. Department of Health and Human Services, Public Health Service.
2. Anger WK, Letz RE, Chrislip DW, Frumkin H, Hudnell K, Kilburn KH, et al. (In press). Neurobehavioral test methods for immediate use in environmental health studies of adults. Neurotoxicol Teratol.
3. Baker E, Letz R, Fidler A, Shalat S, Plantamura D, Lyndon M. (1985). A computer-based neurobehavioral evaluation system for occupational and environmental epidemiology: Methodology and validation studies. Neurobehavioral Toxicology and Teratology 7:369-77.
4. Broadwell DK, Darcey DJ, Hudnell HK, Otto DA, Boyes WK. (In press). Work-site clinical and neurobehavioral assessment of solvent exposed microelectronic workers. Am J Ind Med.
5. Cranmer J, Goldberg L (1986). Report of the proceedings of the workshop on neurobehavioral effects of solvents. Neurotoxicology 7:1-95.
6. Gunst RF, Mason RL. (1980). Regression analysis and its applications. New York: Marcel Dekker.
7. Wright SP (1992). Adjusted p-values for simultaneous inference. Biometrics 48: 1005-13.