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Volumn 181, Issue 3, 1996, Pages 260-268

Simple modification of a commercial scanning laser microscope to incorporate dark-field imaging

Author keywords

Biological application; Confocal laser microscopy; Dark field imaging; Materials application; Off axis systems; On axis systems

Indexed keywords

BIOLOGICAL MATERIALS; CONFOCAL MICROSCOPY;

EID: 0029978039     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1996.127408.x     Document Type: Article
Times cited : (10)

References (12)
  • 1
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    • Fraunhofer diffraction by semicircular apertures
    • Barna, A. (1977) Fraunhofer diffraction by semicircular apertures. J. Opt. Soc. Am. 67, 122-123.
    • (1977) J. Opt. Soc. Am. , vol.67 , pp. 122-123
    • Barna, A.1
  • 2
    • 0026711457 scopus 로고
    • The scanning infra-red microscope (SIRM) and its application to bulk GaAs and Si: A review
    • Booker, G.R., Laczik, Z. & Kidd, P. (1992) The scanning infra-red microscope (SIRM) and its application to bulk GaAs and Si: a review. Semicond. Sci. Technol. 7, A110-A121.
    • (1992) Semicond. Sci. Technol. , vol.7
    • Booker, G.R.1    Laczik, Z.2    Kidd, P.3
  • 5
    • 84893201530 scopus 로고
    • Information capacity and resolution in an optical system
    • Cox, I.J. & Sheppard, C.J.R. (1986) Information capacity and resolution in an optical system. J. Opt. Soc. Am. A. 3, 1152-1158.
    • (1986) J. Opt. Soc. Am. A. , vol.3 , pp. 1152-1158
    • Cox, I.J.1    Sheppard, C.J.R.2
  • 6
    • 0025033786 scopus 로고
    • Study of Golgi-impregnated material using the confocal tandem scanning reflected light microscope
    • Freire, M. & Boyde, A. (1990) Study of Golgi-impregnated material using the confocal tandem scanning reflected light microscope J. Microsc. 158, 285-290.
    • (1990) J. Microsc. , vol.158 , pp. 285-290
    • Freire, M.1    Boyde, A.2
  • 8
    • 85169183864 scopus 로고
    • The effect of spherical aberration and surface reflection on the scanning infra-red microscope imaging of oxide particles in Si
    • in press
    • Laczik, Z., Török, P. & Booker, G.R. (1995) The effect of spherical aberration and surface reflection on the scanning infra-red microscope imaging of oxide particles in Si. Inst. Phys. Conf. Ser., in press.
    • (1995) Inst. Phys. Conf. Ser.
    • Laczik, Z.1    Török, P.2    Booker, G.R.3
  • 9
    • 0020719777 scopus 로고
    • High resolution stereoscopic imaging
    • Sheppard, C.J.R. & Hamilton, D.K. (1983) High resolution stereoscopic imaging. Appl. Opt. 22, 866-867.
    • (1983) Appl. Opt. , vol.22 , pp. 866-867
    • Sheppard, C.J.R.1    Hamilton, D.K.2
  • 11
    • 0005251034 scopus 로고
    • A new confocal SIRM incorporating reflection, transmission and double-pass modes either with or without differential phase contrast imaging
    • Török, P., Booker, G.R., Laczik, Z. & Falster, R. (1995) A new confocal SIRM incorporating reflection, transmission and double-pass modes either with or without differential phase contrast imaging. Inst. Phys. Conf. Ser. 134, 771-774.
    • (1995) Inst. Phys. Conf. Ser. , vol.134 , pp. 771-774
    • Török, P.1    Booker, G.R.2    Laczik, Z.3    Falster, R.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.