Ultratrace characterization of AlSiCu sputter targets for Th, U and 35 other elements by neutron activation analysis

Journal of Radioanalytical and Nuclear Chemistry

Volumn 207, Issue 2, 1996, Pages 445-459

  Lucic, M ^a   Krivan, V ^a  

^a UNIVERSITY OF ULM   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; CONTROLLED STUDY; ELECTRONICS INDUSTRY; INDUSTRY; NEUTRON ACTIVATION ANALYSIS; RADIOCHEMISTRY;

EID: 0029971723     PISSN: 02365731     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02071249     Document Type: Article

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