The atomic force microscope as a tool to study and manipulate local surface properties

Biosensors and Bioelectronics

Volumn 11, Issue 6-7, 1996, Pages 601-612

  Jaschke, Manfred ^a   Butt, Hans Jürgen ^a   Manne, Srin ^b   Gaub, Hermann E ^b   Hasemann, Olaf ^c   Krimphove, Frank ^c   Wolff, Elmar K ^c  

^a MAX PLANCK INSTITUTE OF BIOPHYSICS   (Germany)

^b TECHNICAL UNIVERSITY OF MUNICH   (Germany)

^c Inst Technologieentwicklung S   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGING TECHNIQUES; INTERFACIAL ENERGY; OPTICAL RESOLVING POWER; SURFACE PROPERTIES; VISCOELASTICITY;

ATOMIC FORCE MICROSCOPES; SCANNING NEAR FIELD MICROSCOPES; SURFACE CHARGE DENSITY;

MICROSCOPES;

THIOL;

ATOMIC FORCE MICROSCOPY; CONFERENCE PAPER; IMAGING;

EID: 0029946006     PISSN: 09565663     EISSN: None     Source Type: Journal    
DOI: 10.1016/0956-5663(96)83295-7     Document Type: Conference Paper

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