Inductively coupled plasma atomic emission spectrometric determination of gallium, phosphorus and other oxo-anion forming elements in geological materials

Analyst

Volumn 121, Issue 6, 1996, Pages 825-830

  Satyanarayana, K ^a   Subramaniam, K ^a   Raghunath, A V ^a   Ramanaiah, G V ^a  

^a ATOMIC MINERALS DIRECTORATE FOR EXPLORATION AND RESEARCH   (India)

Author keywords

Gallium determination; Geological materials; Inductively coupled plasma atomic emission spectrometry; Oxo anion forming elements; Phosphorus determination

Indexed keywords

GALLIUM; MOLYBDENUM; PHOSPHORUS; VANADIUM;

ACCURACY; ANALYTIC METHOD; ARTICLE; ATOMIC EMISSION SPECTROMETRY; CONTROLLED STUDY; GEOLOGY; STANDARD;

EID: 0029929171     PISSN: 00032654     EISSN: None     Source Type: Journal    
DOI: 10.1039/an9962100825     Document Type: Article

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