Improved ultrastructural preservation of yeast cells for scanning electron microscopy

Journal of Microscopy

Volumn 184, Issue 2, 1996, Pages 81-87

  Hanschke, R ^a   Schauer, F ^a  

^a UNIVERSITY OF GREIFSWALD   (Germany)

Author keywords

Fixation; Preparation; Reduced shrinkage; Scanning electron microscopy (SEM); Yeast cells

Indexed keywords

CELLS; CYTOLOGY; SHRINKAGE; URANIUM COMPOUNDS; YEAST;

CELL DIAMETERS; CRITICAL POINT DRYING; FIXATION; GLUTARALDEHYDES; OSMIUM TETROXIDE; PREPARATION; REDUCED SHRINKAGE; SCANNING ELECTRON MICROSCOPY; YEAST CELL; YEAST STRAIN;

SCANNING ELECTRON MICROSCOPY;

ARTICLE; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; YEAST;

EID: 0029907872     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1111/j.1365-2818.1996.tb00002.x     Document Type: Article

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